| A flexible and robust soft-error testing system for microelectronic devices and integrated circuits |
| 王晓辉;童腾;苏弘;刘杰;张战刚;古松;刘天奇;孔洁;赵兴文;杨振雷; |
| 关键词：SEE testing;Testing system;Single Event |
| 主要内容：Single event effects(SEEs) induced by radiations become a significant challenge to the reliability for modern electronic |
| 《Nuclear Science and Techniques》 2015,26(03):66-72 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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