| A prediction technique for single-event effects on complex integrated circuits |
| 赵元富;于春青;范隆;岳素格;陈茂鑫;杜守刚;郑宏超; |
| 关键词：complex ICs;duty cycle;prediction of cro |
| 主要内容：The sensitivity of complex integrated circuits to single-event effects is investigated. Sensitivity depends not only on |
| 《Journal of Semiconductors》 2015,36(11):88-92 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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