| Low Cost BIST Scheme Using LFSR-RC Reseeding |
| Bin Zhou;Mingxue Huo;Xinchun Wu; |
| 关键词：built-in self-test;linear feedback shift |
| 主要内容：A novel BIST scheme for reducing the test storage( TS) is presented. The proposed approach relies on a two-dimensional c |
| 《Journal of Harbin Institute of Technolog》 2015,22(03):57-62 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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