| Modeling and simulation of single-event effect in CMOS circuit |
| 岳素格;张晓林;赵元富;刘琳;王汉宁; |
| 关键词：single event effect(SEE);charge collecti |
| 主要内容：This paper reviews the status of research in modeling and simulation of single-event effects(SEE) in digital devices and |
| 《Journal of Semiconductors》 2015,36(11):21-30 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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