| Modeling and understanding of the frequency dependent HPM upset susceptibility of the CMOS inverter |
| YU XinHai;CHAI ChangChun;LIU Yang;YANG Y |
| 关键词：high power microwave;frequency;upset;CMO |
| 主要内容：In this paper, we interpret and, for the first time, model a frequency dependent high-power microwave(HPM) upset suscept |
| 《Science China(Information Sciences)》 2015,58(08):182-192 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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