| Single event soft error in advanced integrated circuit |
| 赵元富;岳素格;赵馨远;陆时进;边强;王亮;孙永姝; |
| 关键词：SET;SEU;MCU;advanced technology |
| 主要内容：As technology feature size decreases, single event upset(SEU), and single event transient(SET) dominate the radiation re |
| 《Journal of Semiconductors》 2015,36(11):7-20 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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