| The single-event effect evaluation technology for nano integrated circuits |
| 郑宏超;赵元富;岳素格;范隆;杜守刚;陈茂鑫;于春青; |
| 关键词：single-event effect;heavy ion test;radia |
| 主要内容：Single-event effects of nano scale integrated circuits are investigated. Evaluation methods for singleevent transients, |
| 《Journal of Semiconductors》 2015,36(11):83-87 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
微信公众号