| Time-Efficient Identification Method for Aging Critical Gates Considering Topological Connection |
| Tian-Song Yu;Hua-Guo Liang;Da-Wen Xu;Lu- |
| 关键词：Aging critical gates;negative bias tempe |
| 主要内容：The shrinking silicon feature size causes the continuous increment of the aging effect due to the negative bias temperat |
| 《Journal of Electronic Science and Techno》 2015,13(03):269-275 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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