| An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations |
| Xin LI;Jin SUN;Fu XIAO;Jiang-shan TIAN; |
| 关键词：Parameter variations;Parametric yield;Mu |
| 主要内容：With shrinking technology,the increase in variability of process,voltage,and temperature(PVT) parameters significantly i |
| 《Frontiers of Information Technology & El》 2016,17(02):160-172 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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