| Area-efficient transient power-rail electrostatic discharge clamp circuit with mis-triggering immunity in a 65-nm CMOS process |
| Yuan WANG;Guangyi LU;Haibing GUO;Jian CA |
| 关键词：electrostatic discharge(ESD);power-rail |
| 主要内容：A novel, area-efficient transient power-rail electrostatic discharge(ESD) clamp circuit is proposed in this work. Curren |
| 《Science China(Information Sciences)》 2016,59(04):112-120 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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