| Computing environmental life of electronic products based on failure physics |
| Yongqiang Zhang;Zongchang Xu;Chunyang Hu |
| 关键词：environmental life;pins;soldered dots;pr |
| 主要内容：In some situations, the accelerated life test on environmental stress for electronic products is not easily implemented |
| 《Journal of Systems Engineering and Elect》 2016,27(02):493-500 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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