| Design for manufacturability and reliability in extreme-scaling VLSI |
| Bei YU;Xiaoqing XU;Subhendu ROY;Yibo LIN |
| 关键词：design for manufacturability;design for |
| 主要内容：In the last five decades, the number of transistors on a chip has increased exponentially in accordance with the Moore's |
| 《Science China(Information Sciences)》 2016,59(06):96-118 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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