| Experimental characterization of the bipolar effect on P-hit single-event transients in 65 nm twin-well and triple-well CMOS technologies |
| CHEN JianJun;LIANG Bin;CHI YaQing; |
| 关键词：single event transient(SET);bipolar effe |
| 主要内容：Single-event charge collection is controlled by drift, diffusion and the bipolar effect. Previous work has established t |
| 《Science China(Technological Sciences)》 2016,59(03):488-493 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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