| Single event upset induced by single event double transient and its well-structure dependency in 65-nm bulk CMOS technology |
| Pengcheng HUANG;Shuming CHEN;Jianjun CHE |
| 关键词：single event upset (SEU);single event do |
| 主要内容：Single event upset (SEU) is one of the most important origins of soft errors in aerospace applications.As technology sca |
| 《Science China(Information Sciences)》 2016,59(04):152-159 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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