| Analysis of single event transient pulse-width in 65 nm commercial radiation-hardened logic cell |
| Haisong Li;Longsheng Wu;Bo Yang;Yihu Jia |
| 关键词：single event effect;single event transie |
| 主要内容：With the critical charge reduced to generate a single event effect(SEE) and high working frequency for a nanometer integ |
| 《Journal of Semiconductors》 2017,38(08):104-108 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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