| Detection of Sunken Defects on the FPC Trace |
| LI Dejian;YUAN Weiqi; |
| 关键词：FPC;Trace;Sunken Defect;Linear Differenc |
| 主要内容：Trace is the important composition structure of printed circuit board,w hich connects the devices,it is also the module |
| 《Instrumentation》 2017,4(02):1-8 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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