| Research on COB De-embedding in Scattering Parameter Measurement |
| Lei Wang;Jingyi Zhang; |
| 关键词：S parameter;COB;de-embedding |
| 主要内容：The popular radio frequency(RF) chip on board(COB) test has gradually taken the place of onwafer test due to the high ef |
| 《Journal of Harbin Institute of Technolog》 2017,24(01):37-42 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
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