| An Easy Way to Quantify the Adhesion Energy of Nanostructured Cu_X(X=Cr,Ta,Mo,Nb,Zr) Multilayer Films |
| Kai Wu;Jin-Yu Zhang;Gang Liu;J |
| 关键词：Uniaxial tensile testing;Nanostructured multilayer |
| 主要内容：An approach based on film buckling under simple uniaxial tensile testing was utilized in this paper to quantitatively estimate the interfacial energy |
| 《Acta Metallurgica Sinica(English Letters)》 2016(2).181-187 |
| 全文下载请进入http://hightech.stlib.cn/tpi_1/sysasp/include/index.asp |
微信公众号